$599
Includes Free Shipping*
35 Years. One Massive Thank You.
Mannys Means Music - and it has for 35 years. To celebrate, we're giving one lucky customer a $3,500 store voucher
Between October 1st and December 31st 2026, spend $350 or more in-store or online and enter to win a $3,500 Mannys store voucher, on us! Enter with your order number via the entry form. T&Cs apply. ACT excluded. Purchase must be made between October 1st and December 31st 2026, 11:59pm AEDT. Entries close January 11 2027, 11:59pm AEDT.
Product Information
The Audix TM1 Plus is a 6 mm pre–polarised condenser measurement microphone engineered for acoustic testing, room analysis, and sound system calibration. Built by Audix in the USA with all–brass four–stage construction, it delivers the linearity and frequency accuracy that studio engineers, sound technicians, and recording enthusiasts need when analysing room acoustics or validating audio gear. The uniformly controlled omnidirectional polar pattern captures sound evenly from all directions, making it the reference tool for serious measurement work.
The TM1 Plus operates across a flat frequency range of 20 Hz to 20 kHz, requiring 18–52 V phantom power from an XLR connection. It ships with a calibration data file, acoustic windscreen, and CA4231 machined calibration adapter for use with Brüel & Kjær sound level calibrators or equivalent devices. The fixed omnidirectional pattern and consistent response eliminate the variables that plague cheaper test mics, ensuring measurement results stay reliable across different rooms and equipment setups.
Features
- 6 mm pre–polarised condenser element with omnidirectional polar pattern
- Frequency response 20 Hz–20 kHz, flat across the audio spectrum
- All–brass four–stage construction, designed and assembled in the USA
- Requires 18–52 V phantom power via XLR connector
- Includes calibration data file for Brüel & Kjær 4231 calibrators
- Threaded acoustic windscreen supplied as standard
- CA4231 machined calibration adapter included
- Consistent linearity and accuracy across repeated measurements




